Publication
Title
An efficient way of including thermal diffuse scattering in simulation of scanning transmission electron microscopic images
Author
Abstract
We propose an improved image simulation procedure for atomic-resolution annular dark-field scanning transmission electron microscopy (STEM) based on the multislice formulation, which takes thermal diffuse scattering fully into account. The improvement with regard to the classical frozen phonon approach is realized by separating the lattice configuration statistics from the dynamical scattering so as to avoid repetitive calculations. As an example, the influence of phonon scattering on the image contrast is calculated and investigated. STEM image simulation of crystals can be applied with reasonable computing times to problems involving a large number of atoms and thick or large supercells.
Language
English
Source (journal)
Ultramicroscopy. - Amsterdam
Publication
Amsterdam : 2006
ISSN
0304-3991
DOI
10.1016/J.ULTRAMIC.2006.04.006
Volume/pages
106 :10 (2006) , p. 933-940
ISI
000240397200006
Full text (Publisher's DOI)
UAntwerpen
Faculty/Department
Research group
Publication type
Subject
Affiliation
Publications with a UAntwerp address
External links
Web of Science
Record
Identifier
Creation 28.03.2011
Last edited 12.11.2024
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