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Title
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Off-stoichiometry effects on the crystalline and defect structure of hexagonal manganite films (RE = Y, Er, Dy)
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Author
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Abstract
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| The crystalline and defect structure of epitaxial hexagonal RExMnyO3 (RE = Er, Dy) films with varying cationic composition was investigated by X-ray diffraction and transmission electron microscopy. The films are composed of a strained layer at the interface with the substrate and of a relaxed layer on top of it. The critical thickness is of 10 to 25 nm. For Mn-rich films (or RE deficient), an off-stoichiometric composition maintaining the hexagonal LuMnO3-type structure is stabilized over a large range of the RE/Mn ratio (0.72−1.00), with no Mn-rich secondary phases observed. A linear dependence of the out-of-plane lattice parameter with RE/Mn is observed in this range. Out-of-phase boundary (OPB) extended defects are observed in all films and exhibit a local change in stoichiometry. Such a large solubility limit in the RE deficient region points toward the formation of vacancies on the RE site (RExMnO3−δ, with 0.72 ≤ x < 1), a phenomenon that is encountered in perovskite manganites such as LaxMnO3−δ (x < 1) and that may strongly impact the physical properties of hexagonal manganites. |
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Language
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English
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Source (journal)
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Chemistry of materials / American Chemical Society. - Washington, D.C., 1989, currens
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Publication
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Washington, D.C.
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2011
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ISSN
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0897-4756
[print]
1520-5002
[online]
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DOI
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10.1021/CM1029358
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Volume/pages
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23
:5
(2011)
, p. 1232-1238
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ISI
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000287767200022
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Full text (Publisher's DOI)
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