Title Off-stoichiometry effects on the crystalline and defect structure of hexagonal manganite $REMnO_{3}$ films (RE = Y, Er, Dy)Off-stoichiometry effects on the crystalline and defect structure of hexagonal manganite $REMnO_{3}$ films (RE = Y, Er, Dy) Author Gélard, J. Jehanathan, N. Roussel, H. Gariglio, S. Lebedev, O.I. Van Tendeloo, G. Dubourdieu, C. Faculty/Department Faculty of Sciences. Physics Research group Electron microscopy for materials research (EMAT) Publication type article Publication 2011Washington, D.C., 2011 Subject Physics Source (journal) Chemistry of materials / American Chemical Society. - Washington, D.C. Volume/pages 23(2011):5, p. 1232-1238 ISSN 0897-4756 ISI 000287767200022 Carrier E Target language English (eng) Full text (Publishers DOI) Affiliation University of Antwerp Abstract The crystalline and defect structure of epitaxial hexagonal RExMnyO3 (RE = Er, Dy) films with varying cationic composition was investigated by X-ray diffraction and transmission electron microscopy. The films are composed of a strained layer at the interface with the substrate and of a relaxed layer on top of it. The critical thickness is of 10 to 25 nm. For Mn-rich films (or RE deficient), an off-stoichiometric composition maintaining the hexagonal LuMnO3-type structure is stabilized over a large range of the RE/Mn ratio (0.72−1.00), with no Mn-rich secondary phases observed. A linear dependence of the out-of-plane lattice parameter with RE/Mn is observed in this range. Out-of-phase boundary (OPB) extended defects are observed in all films and exhibit a local change in stoichiometry. Such a large solubility limit in the RE deficient region points toward the formation of vacancies on the RE site (RExMnO3−δ, with 0.72 ≤ x < 1), a phenomenon that is encountered in perovskite manganites such as LaxMnO3−δ (x < 1) and that may strongly impact the physical properties of hexagonal manganites. E-info http://gateway.webofknowledge.com/gateway/Gateway.cgi?GWVersion=2&SrcApp=PARTNER_APP&SrcAuth=LinksAMR&KeyUT=WOS:000287767200022&DestLinkType=RelatedRecords&DestApp=ALL_WOS&UsrCustomerID=ef845e08c439e550330acc77c7d2d848 http://gateway.webofknowledge.com/gateway/Gateway.cgi?GWVersion=2&SrcApp=PARTNER_APP&SrcAuth=LinksAMR&KeyUT=WOS:000287767200022&DestLinkType=FullRecord&DestApp=ALL_WOS&UsrCustomerID=ef845e08c439e550330acc77c7d2d848 http://gateway.webofknowledge.com/gateway/Gateway.cgi?GWVersion=2&SrcApp=PARTNER_APP&SrcAuth=LinksAMR&KeyUT=WOS:000287767200022&DestLinkType=CitingArticles&DestApp=ALL_WOS&UsrCustomerID=ef845e08c439e550330acc77c7d2d848 Handle