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Title
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Fitting the momentum dependent loss function in EELS
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Author
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Abstract
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| Momentum dependent inelastic plasmon scattering can be measured by electron energy loss in a transmission electron microscope. From energy filtered diffraction, the characteristic angle of scattering and the cutoff angle are measured, using a thin film of aluminum as a model test. Rather than deconvolving the data (as done in previous works), a fitting technique is used to extract the loss function from angular resolved spectra, starting from a simple model simulation. |
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Language
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English
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Source (journal)
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Microscopy research and technique. - New York, N.Y.
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Publication
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New York, N.Y.
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2011
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ISSN
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1059-910X
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DOI
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10.1002/JEMT.20894
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Volume/pages
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74
:3
(2011)
, p. 212-218
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ISI
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000288095200002
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Full text (Publisher's DOI)
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