Publication
Title
Fitting the momentum dependent loss function in EELS
Author
Abstract
Momentum dependent inelastic plasmon scattering can be measured by electron energy loss in a transmission electron microscope. From energy filtered diffraction, the characteristic angle of scattering and the cutoff angle are measured, using a thin film of aluminum as a model test. Rather than deconvolving the data (as done in previous works), a fitting technique is used to extract the loss function from angular resolved spectra, starting from a simple model simulation.
Language
English
Source (journal)
Microscopy research and technique. - New York, N.Y.
Publication
New York, N.Y. : 2011
ISSN
1059-910X
Volume/pages
74:3(2011), p. 212-218
ISI
000288095200002
Full text (Publisher's DOI)
UAntwerpen
Faculty/Department
Research group
Publication type
Subject
Affiliation
Publications with a UAntwerp address
External links
Web of Science
Record
Identification
Creation 10.05.2011
Last edited 23.06.2017
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