Publication
Title
Ultra-low-angle microtomy to back up S-SIMS molecular depth profiling with and for the nanoscale analysis of high-tech industrial materials
Author
Abstract
Language
English
Source (journal)
Surface and interface analysis. - London
Publication
London : 2011
ISSN
0142-2421
Volume/pages
43:1/2(2011), p. 389-392
ISI
000287669500096
Full text (Publisher's DOI)
UAntwerpen
Faculty/Department
Research group
Publication type
Subject
Affiliation
Publications with a UAntwerp address
External links
Web of Science
Record
Identification Error report