Publication
Title
Optics for X-ray microfluorescence to be used at the European synchrotron radiation facility
Author
Language
English
Source (journal)
Advances in X-ray analysis. - New York, N.Y.
Publication
New York, N.Y. : 1994
ISSN
0376-0308
Volume/pages
37 (1994) , p. 553-563
ISI
A1994BB55S00067
UAntwerpen
Faculty/Department
Research group
Publication type
Affiliation
Publications with a UAntwerp address
External links
Web of Science
Record
Identifier
Creation 08.10.2008
Last edited 17.12.2021
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