Publication
Title
Ultrahigh strain hardening in thin palladium films with nanoscale twins
Author
Abstract
Nanocrystalline Pd thin films containing coherent growth twin boundaries are deformed using on-chip nanomechanical testing. A large work-hardening capacity is measured. The origin of the observed behavior is unraveled using transmission electron microscopy and shows specific dislocations and twin boundaries interactions. The results indicate the potential for large strength and ductility balance enhancement in Pd films, as needed in membranes for H technologies.
Language
English
Source (journal)
Advanced materials. - Weinheim
Publication
Weinheim : 2011
ISSN
0935-9648
Volume/pages
23:18(2011), p. 2119-2122
ISI
000291164200013
Full text (Publisher's DOI)
UAntwerpen
Faculty/Department
Research group
Publication type
Subject
Affiliation
Publications with a UAntwerp address
External links
Web of Science
Record
Identification
Creation 13.07.2011
Last edited 08.08.2017
To cite this reference