Publication
Title
FIB/SEM applied to quantitative 3D analysis of precipitates in Ni-Ti
Author
Abstract
Language
English
Source (journal)
Diffusion and defect data : solid state data : part B : solid state phenomena. - Vaduz, 1988, currens
Publication
Vaduz : 2011
ISSN
1012-0394 [print]
1662-9779 [online]
Volume/pages
172/174(2011), p. 1284-1289
ISI
000303359700199
Full text (Publisher's DOI)
Full text (publisher's version - intranet only)
UAntwerpen
Faculty/Department
Research group
Publication type
Subject
Affiliation
Publications with a UAntwerp address
External links
Web of Science
Record
Identification
Creation 15.07.2011
Last edited 06.02.2018
To cite this reference