Title
Microscopic X-ray fluorescence analysis with synchrotron radiation sourcesMicroscopic X-ray fluorescence analysis with synchrotron radiation sources
Author
Faculty/Department
Faculty of Sciences. Chemistry
Research group
Department of Chemistry - other
Department of Chemistry
Publication type
bookPart
Publication
Berlin :Springer, [*]
Subject
Chemistry
Source (book)
Handbook of nuclear chemistry : volume 3 : chemical applications of nuclear reactions and radiation / Vértes, A. [edit.]; et al. [edit.]
ISBN - Hoofdstuk
978-1-4419-0719-6
Carrier
E
Target language
English (eng)
Full text (Publishers DOI)
Affiliation
University of Antwerp
Abstract
This chapter deals with the analytical applications of synchrotron radiation sources for trace-level analysis of materials on microscopic and submicroscopic scales. Elemental analysis with X-ray fluorescence is described in detail. Two-dimensional (2D) and three-dimensional (3D) analyses are discussed in their quantitative aspects. Related methods of analysis based on absorption edge phenomena such as X-ray absorption spectrometry (XAS) and near-edge scanning spectrometry (XANES) yielding molecular information, computerized X-ray fluorescence microtomography (XFCT) based on the penetrative character of X-rays, and microscopic X-ray diffraction (XRD) providing structural data on the sample are also briefly discussed. The methodological treatment is illustrated with a number of applications.
Handle