Microscopic X-ray fluorescence analysis with synchrotron radiation sourcesMicroscopic X-ray fluorescence analysis with synchrotron radiation sources
Faculty of Sciences. Chemistry
Department of Chemistry - other
Department of Chemistry
Berlin :Springer, 2011[*]2011
Handbook of nuclear chemistry : volume 3 : chemical applications of nuclear reactions and radiation / Vértes, A. [edit.]; et al. [edit.]
University of Antwerp
This chapter deals with the analytical applications of synchrotron radiation sources for trace-level analysis of materials on microscopic and submicroscopic scales. Elemental analysis with X-ray fluorescence is described in detail. Two-dimensional (2D) and three-dimensional (3D) analyses are discussed in their quantitative aspects. Related methods of analysis based on absorption edge phenomena such as X-ray absorption spectrometry (XAS) and near-edge scanning spectrometry (XANES) yielding molecular information, computerized X-ray fluorescence microtomography (XFCT) based on the penetrative character of X-rays, and microscopic X-ray diffraction (XRD) providing structural data on the sample are also briefly discussed. The methodological treatment is illustrated with a number of applications.