Publication
Title
Microscopic X-ray fluorescence analysis with synchrotron radiation sources
Author
Abstract
This chapter deals with the analytical applications of synchrotron radiation sources for trace-level analysis of materials on microscopic and submicroscopic scales. Elemental analysis with X-ray fluorescence is described in detail. Two-dimensional (2D) and three-dimensional (3D) analyses are discussed in their quantitative aspects. Related methods of analysis based on absorption edge phenomena such as X-ray absorption spectrometry (XAS) and near-edge scanning spectrometry (XANES) yielding molecular information, computerized X-ray fluorescence microtomography (XFCT) based on the penetrative character of X-rays, and microscopic X-ray diffraction (XRD) providing structural data on the sample are also briefly discussed. The methodological treatment is illustrated with a number of applications.
Language
English
Source (book)
Handbook of nuclear chemistry : volume 3 : chemical applications of nuclear reactions and radiation / Vértes, A. [edit.]; et al. [edit.]
Publication
Berlin : Springer, 2011
ISBN
978-1-4419-0719-6
Volume/pages
p. 1738-1759
Full text (Publishers DOI)
UAntwerpen
Faculty/Department
Research group
Publication type
Subject
Affiliation
Publications with a UAntwerp address
External links
Record
Identification
Creation 15.07.2011
Last edited 22.11.2016
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