|
Title
|
|
|
|
Microscopic X-ray fluorescence analysis with synchrotron radiation sources
|
|
|
Author
|
|
|
|
|
|
|
Abstract
|
|
|
|
| This chapter deals with the analytical applications of synchrotron radiation sources for trace-level analysis of materials on microscopic and submicroscopic scales. Elemental analysis with X-ray fluorescence is described in detail. Two-dimensional (2D) and three-dimensional (3D) analyses are discussed in their quantitative aspects. Related methods of analysis based on absorption edge phenomena such as X-ray absorption spectrometry (XAS) and near-edge scanning spectrometry (XANES) yielding molecular information, computerized X-ray fluorescence microtomography (XFCT) based on the penetrative character of X-rays, and microscopic X-ray diffraction (XRD) providing structural data on the sample are also briefly discussed. The methodological treatment is illustrated with a number of applications. |
|
|
|
Language
|
|
|
|
English
|
|
|
Source (book)
|
|
|
|
Handbook of nuclear chemistry : volume 3 : chemical applications of nuclear reactions and radiation / Vértes, A. [edit.]; et al. [edit.]
|
|
|
Publication
|
|
|
|
Berlin
:
Springer
,
2011
|
|
|
ISBN
|
|
|
|
978-1-4419-0719-6
|
|
|
DOI
|
|
|
|
10.1007/978-1-4419-0720-2_34
|
|
|
Volume/pages
|
|
|
|
p. 1738-1759
|
|
|
Full text (Publisher's DOI)
|
|
|
|
|
|