Publication
Title
Exploring different inelastic projection mechanisms for electron tomography
Author
Abstract
Several different projection mechanisms that all make use of inelastically scattered electrons are used for electron tomography. The advantages and the disadvantages of these methods are compared to HAADFSTEM tomography, which is considered as the standard electron tomography technique in materials science. The different inelastic setups used are energy filtered transmission electron microscopy (EFTEM), thickness mapping based on the log-ratio method and bulk plasmon mapping. We present a comparison that can be used to select the best inelastic signal for tomography, depending on different parameters such as the beam stability and nature of the sample. The appropriate signal will obviously also depend on the exact information which is requested.
Language
English
Source (journal)
Ultramicroscopy. - Amsterdam
Publication
Amsterdam : 2011
ISSN
0304-3991
Volume/pages
111:8(2011), p. 1262-1267
ISI
000300461100039
Full text (Publisher's DOI)
Full text (publisher's version - intranet only)
UAntwerpen
Faculty/Department
Research group
[E?say:metaLocaldata.cgzprojectinf]
Plasmon Holography
Optimalization of Focused Ion Deam (FIB) sample preparation for transmission electron microscopy of alloys.
Development of discrete tomography for transmission electron microscopy: 3D imaging of interfaces in ceramic and semiconducting multilayers.
Publication type
Subject
Affiliation
Publications with a UAntwerp address
External links
Web of Science
Record
Identification
Creation 21.09.2011
Last edited 09.08.2017
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