Publication
Title
Point defect clusters and dislocations in FIB irradiated nanocrystalline aluminum films : an electron tomography and aberration-corrected high-resolution ADF-STEM study
Author
Abstract
Language
English
Source (journal)
Microscopy and microanalysis. - Cambridge, Mass.
Publication
Cambridge, Mass. : 2011
ISSN
1431-9276
Volume/pages
17:6(2011), p. 983-990
ISI
000297832300018
Full text (Publisher's DOI)
UAntwerpen
Faculty/Department
Research group
Publication type
Subject
Affiliation
Publications with a UAntwerp address
External links
Web of Science
Record
Identification
Creation 18.01.2012
Last edited 19.01.2018
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