Title
Imaging from atomic structure to electronic structure Imaging from atomic structure to electronic structure
Author
Faculty/Department
Faculty of Sciences. Physics
Publication type
article
Publication
Oxford ,
Subject
Physics
Chemistry
Source (journal)
Micron. - Oxford
Volume/pages
43(2012) :4 , p. 524-531
ISSN
0968-4328
ISI
000301702400005
Carrier
E
Target language
English (eng)
Full text (Publishers DOI)
Affiliation
University of Antwerp
Abstract
This paper discusses the possibility of retrieving the electron distribution (with highlighted valence electron distribution information) of materials from recorded HREM images. This process can be achieved by solving two inverse problems: reconstruction of the exit wave and reconstruction of the electron distribution from exit waves. The first inverse problem can be solved using a focal series reconstruction method. We show that the second inverse problem can be solved by combining a series of exit waves recorded at different thickness conditions. This process is designed based on an improved understanding of the dynamical scattering process. It also explains the fundamental difficulty of obtaining the valence electron distribution information and the basis of our solution.
E-info
https://repository.uantwerpen.be/docman/iruaauth/a9fdf2/75fa60a2c28.pdf
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