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Title
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Nanoscale spectroscopy with polarized X-rays by NEXAFS-TXM
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Author
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Abstract
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| Near-edge X-ray absorption spectroscopy (NEXAFS)1 is an essential analytical tool in material science. Combining NEXAFS with scanning transmission X-ray microscopy (STXM) adds spatial resolution and the possibility to study individual nanostructures2, 3. Here, we describe a full-field transmission X-ray microscope (TXM) that generates high-resolution, large-area NEXAFS data with a collection rate two orders of magnitude faster than is possible with STXM. The TXM optical design combines a spectral resolution of E/ΔE = 1 × 104 with a spatial resolution of 25 nm in a field of view of 1520 µm and a data acquisition time of ~1 s. As an example, we present image stacks and polarization-dependent NEXAFS spectra from individual anisotropic sodium and protonated titanate nanoribbons. Our NEXAFS-TXM technique has the advantage that one image stack visualizes a large number of nanostructures and therefore already contains statistical information. This new high-resolution NEXAFS-TXM technique opens the way to advanced nanoscale science studies. |
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Language
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English
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Source (journal)
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Nature photonics
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Publication
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2012
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ISSN
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1749-4885
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DOI
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10.1038/NPHOTON.2011.268
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Volume/pages
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6
:1
(2012)
, p. 25-29
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ISI
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000298416200011
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Full text (Publisher's DOI)
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Full text (publisher's version - intranet only)
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