Title
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High strength-ductility of thin nanocrystalline palladium films with nanoscale twins : on-chip testing and grain aggregate model
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Author
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Abstract
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The mechanical behaviour of thin nanocrystalline palladium films with an ∼30 nm in plane grain size has been characterized on chip under uniaxial tension. The films exhibit a large strain hardening capacity and a significant increase in the strength with decreasing thickness. Transmission electron microscopy has revealed the presence of a moderate density of growth nanotwins interacting with dislocations. A semi-analytical grain aggregate model is proposed to investigate the impact of different contributions to the flow behaviour, involving the effect of twins, of grain size and of the presence of a thin surface layer. This model provides guidelines to optimizing the strength/ductility ratio of the films. |
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Language
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English
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Source (journal)
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Acta materialia. - Oxford
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Publication
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Oxford
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2012
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ISSN
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1359-6454
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DOI
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10.1016/J.ACTAMAT.2011.11.054
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Volume/pages
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60
:4
(2012)
, p. 1795-1806
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ISI
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000301989500035
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Full text (Publisher's DOI)
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Full text (publisher's version - intranet only)
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