Publication
Title
Transmission electron microscopy characterisation of Ti and Al/Ti contacts on GaN and AlGaN/GaN
Author
Abstract
Language
English
Source (journal)
Springer proceedings in physics / Association for the Study of Internal Secretions. - Berlin
Publication
Berlin : 2005
ISSN
0930-8989
Volume/pages
107(2005), p. 389-392
ISI
000237833300083
UAntwerpen
Faculty/Department
Research group
Publication type
Subject
Affiliation
Publications with a UAntwerp address
External links
Web of Science
Record
Identification
Creation 24.02.2012
Last edited 08.12.2018
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