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Title
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Resolution enhancement of secondary ion microprobe images using Fourier deconvolution
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Author
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Language
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English
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Source (journal)
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Vacuum: the international journal and abstracting service for vacuum science and technology. - Oxford
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Publication
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Oxford
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1994
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ISSN
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0042-207X
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DOI
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10.1016/0042-207X(94)90318-2
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Volume/pages
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45
:4
(1994)
, p. 447-450
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ISI
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A1994ND40500014
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Full text (Publisher's DOI)
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