Publication
Title
Resolution enhancement of secondary ion microprobe images using Fourier deconvolution
Author
Language
English
Source (journal)
Vacuum: the international journal and abstracting service for vacuum science and technology. - Oxford
Publication
Oxford : 1994
ISSN
0042-207X
Volume/pages
45:4(1994), p. 447-450
ISI
A1994ND40500014
Full text (Publisher's DOI)
UAntwerpen
Faculty/Department
Research group
Publication type
Affiliation
Publications with a UAntwerp address
External links
Web of Science
Record
Identification
Creation 08.10.2008
Last edited 15.12.2017
To cite this reference