| Title |
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Quantitative characterization of individual particle surfaces by fractal analysis of scanning electron microscope images
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| Author |
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| Language |
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English
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| Source (journal) |
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Fresenius' journal of analytical chemistry. - Berlin, 1990 - 2001 | |
| Publication |
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Berlin : 1994
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| ISSN |
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0937-0633
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| Volume/pages |
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350(1994), p. 440-447
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| ISI |
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A1994PR64400005
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| Full text (Publisher's DOI) |
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