Publication
Title
Mathematical-modeling of secondary-ion energy-spectra
Author
Abstract
An attempt has been made to compose a mathematical model of secondary ion energy spectra, taking into account the sputter process, the ionization process and the transmission of the secondary ion mass spectrometer. In this model a new equation for the transmission of the instrument was formulated. The percentage fit of the model was equal to 99.9+% for 80% of the tested cases and 99+% for all measured energy distributions. A total of 59 energy distributions were tested. It was hoped that the various mathematical parameters used in the expressions to describe the above processes and characteristics will provide a direct link with the variation of the measured isotopic ratios and hence a better insight into the reasons for this variation. Unfortunately, this objective was not achieved since the uncertainty of the calculated ratio by model-fitting the energy distributions is larger than the measured uncertainty. However, the model provides some insight into the energy dependent fractionation observed within individual measurements.
Language
English
Source (journal)
International journal of mass spectrometry and ion processes. - Amsterdam
Publication
Amsterdam : 1993
ISSN
0168-1176
Volume/pages
128:3(1993), p. 173-179
ISI
A1993MF78600007
Full text (Publisher's DOI)
UAntwerpen
Faculty/Department
Research group
Publication type
Subject
External links
Web of Science
Record
Identification
Creation 29.02.2012
Last edited 14.10.2017