Publication
Title
Exit wave reconstructions of surfaces and interfaces using through focus series of HREM images
Author
Abstract
The through focus exit wave reconstruction technique uses a series of high resolution electron microscopy (HREM) images to reconstruct the complex electron wavefunction at the exit plane of the specimen. The main advantage of this technique compared to conventional HREM is better interpretable images due to the deblurring of the information. This is in particular valid for surfaces and interfaces, as is shown by examples of exit waves of a (001) surface of NiO, a single slab of (Mo,Co)S-2 on gamma-Al2O3 and the sapphire/CeO2 interface. (C) 2000 Elsevier Science B.V. All rights reserved.
Language
English
Source (journal)
Solid state ionics. - Amsterdam
Source (book)
Conference on Interfacially Controlled Functional Materials: Electrical, and Chemical Properties, March 08-13, 1998, Schloss Ringberg, Germany
Publication
Amsterdam : Elsevier, 2000
ISSN
0167-2738
Volume/pages
131:1-2(2000), p. 35-49
ISI
000088323800005
Full text (Publishers DOI)
UAntwerpen
Faculty/Department
Research group
Publication type
Subject
Affiliation
Publications with a UAntwerp address
External links
Web of Science
Record
Identification
Creation 01.03.2012
Last edited 09.05.2017
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