Title
Exit wave reconstructions of surfaces and interfaces using through focus series of HREM images
Author
Faculty/Department
Faculty of Sciences. Physics
Publication type
article
Publication
Amsterdam :Elsevier ,
Subject
Physics
Chemistry
Source (journal)
Solid state ionics. - Amsterdam
Source (book)
Conference on Interfacially Controlled Functional Materials: Electrical, and Chemical Properties, March 08-13, 1998, Schloss Ringberg, Germany
Volume/pages
131(2000) :1-2 , p. 35-49
ISSN
0167-2738
ISI
000088323800005
Carrier
E
Target language
English (eng)
Full text (Publishers DOI)
Affiliation
University of Antwerp
Abstract
The through focus exit wave reconstruction technique uses a series of high resolution electron microscopy (HREM) images to reconstruct the complex electron wavefunction at the exit plane of the specimen. The main advantage of this technique compared to conventional HREM is better interpretable images due to the deblurring of the information. This is in particular valid for surfaces and interfaces, as is shown by examples of exit waves of a (001) surface of NiO, a single slab of (Mo,Co)S-2 on gamma-Al2O3 and the sapphire/CeO2 interface. (C) 2000 Elsevier Science B.V. All rights reserved.
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