Publication
Title
Defect induced thickness growth in silver chloride (111) tabular crystals: a TEM study.
Author
Abstract
Language
English
Source (book)
International Symposium on Silver Halide Imaging, Sep. 11-14, 2000, St. Adele, Canada
Publication
Springfield : Soc imaging science & technology, 2000
ISBN
0-89208-229-1
Volume/pages
p. 38-43
ISI
000183315900012
UAntwerpen
Faculty/Department
Research group
Publication type
Subject
Affiliation
Publications with a UAntwerp address
External links
Web of Science
Record
Identification
Creation 01.03.2012
Last edited 18.07.2018
To cite this reference