Publication
Title
Characterisation of multilayer ramp-type structures by scanning probe microscopy and high-resolution electron microscopy
Author
Abstract
Language
English
Source (journal)
Journal of alloys and compounds. - Amsterdam
Source (book)
Symposium on High Temperature Superconductor Thin Films, Growth, Mechanisms, Interfaces, Multilayers, at the 1996 Spring Meeting of the European-Materials-Society, June 04-07, 1996, Strasbourg, France
Publication
Lausanne : Elsevier Science, 1997
ISSN
0925-8388
Volume/pages
251:1-2(1997), p. 206-208
ISI
A1997XM34000046
Full text (Publisher's DOI)
UAntwerpen
Faculty/Department
Research group
Publication type
Subject
Affiliation
Publications with a UAntwerp address
External links
Web of Science
Record
Identification
Creation 01.03.2012
Last edited 11.08.2018
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