Publication
Title
Characterization of nanostructures by virtue of the phenomena due to the electron-phonon interaction
Author
Abstract
Language
English
Source (journal)
Applied surface science. - Amsterdam
Source (book)
5th International Conference on Formation of Semiconductor Interfaces, (ICFSI-5), June 26-30, 1995, Princeton, N.J.
Publication
Amsterdam : Elsevier, 1996
ISSN
0169-4332
Volume/pages
104(1996), p. 546-551
ISI
A1996VR57300087
Full text (Publisher's DOI)
UAntwerpen
Faculty/Department
Research group
Publication type
Subject
Affiliation
Publications with a UAntwerp address
External links
Web of Science
Record
Identification
Creation 01.03.2012
Last edited 15.09.2018
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