Publication
Title
Accurate evaluation of -PIXE and -XRF spectral data through iterative least squares fitting
Author
Abstract
Language
English
Source (journal)
Nuclear instruments and methods in physics research: B: beam interactions with materials and atoms. - Amsterdam
Source (book)
7th International Conference on Particle Induced X-ray Emission and Its Analytical Applications, MAY 26-30, 1995, Abano Terme, Italy
Publication
Amsterdam : Elsevier, 1996
ISSN
0168-583X
Volume/pages
109(1996), p. 179-185
ISI
A1996UV44400035
Full text (Publisher's DOI)
UAntwerpen
Faculty/Department
Research group
Publication type
Subject
External links
Web of Science
Record
Identification
Creation 01.03.2012
Last edited 24.09.2018