Publication
Title
Structural characterization of ion beam synthesized epitaxial ErSi2-x layers
Author
Language
English
Source (journal)
Materials Research Society symposium proceedings. - Wuhan
Source (book)
Symposium on Silicide Thin Films - Fabrication, Properties, and, Applications, at the 1995 MRS Fall Meeting, NOV 27-30, 1995, BOSTON, MA
Publication
Pittsburgh : Materials research soc, 1996
ISBN
1-55899-305-3
Volume/pages
402, p. 499-504
ISI
A1996BF20H00071
UAntwerpen
Publication type
Subject
External links
Web of Science
Record
Identification
Creation 01.03.2012
Last edited 16.12.2017