Title
|
|
|
|
Structural characterization of ion beam synthesized epitaxial ErSi2-x layers
| |
Author
|
|
|
|
| |
Language
|
|
|
|
English
| |
Source (journal)
|
|
|
|
Materials Research Society symposium proceedings. - Wuhan
| |
Source (book)
|
|
|
|
Symposium on Silicide Thin Films - Fabrication, Properties, and, Applications, at the 1995 MRS Fall Meeting, NOV 27-30, 1995, BOSTON, MA
| |
Publication
|
|
|
|
Pittsburgh
:
Materials research soc
,
1996
| |
ISBN
|
|
|
|
1-55899-305-3
| |
DOI
|
|
|
|
10.1557/PROC-402-499
| |
Volume/pages
|
|
|
|
402
, p. 499-504
| |
ISI
|
|
|
|
A1996BF20H00071
| |
Full text (Publisher's DOI)
|
|
|
|
| |
|