Title
Structural characterization of ion beam synthesized epitaxial ErSi2-x layersStructural characterization of ion beam synthesized epitaxial ErSi2-x layers
Author
Publication type
conferenceObject
Publication
Pittsburgh :Materials research soc,
Subject
Physics
Source (journal)
Materials Research Society symposium proceedings. - Wuhan
Source (book)
Symposium on Silicide Thin Films - Fabrication, Properties, and, Applications, at the 1995 MRS Fall Meeting, NOV 27-30, 1995, BOSTON, MA
Volume/pages
402(), p. 499-504
ISSN
0272-9172
ISBN
1-55899-305-3
ISI
A1996BF20H00071
Carrier
E
Target language
English (eng)
E-info
http://gateway.webofknowledge.com/gateway/Gateway.cgi?GWVersion=2&SrcApp=PARTNER_APP&SrcAuth=LinksAMR&KeyUT=WOS:A1996BF20H00071&DestLinkType=FullRecord&DestApp=ALL_WOS&UsrCustomerID=ef845e08c439e550330acc77c7d2d848
http://gateway.webofknowledge.com/gateway/Gateway.cgi?GWVersion=2&SrcApp=PARTNER_APP&SrcAuth=LinksAMR&KeyUT=WOS:A1996BF20H00071&DestLinkType=CitingArticles&DestApp=ALL_WOS&UsrCustomerID=ef845e08c439e550330acc77c7d2d848