Title
Structural aspects of the combination of Si and YBa2Cu3O7-x Structural aspects of the combination of Si and YBa2Cu3O7-x
Author
Faculty/Department
Faculty of Sciences. Physics
Publication type
article
Publication
Subject
Physics
Source (journal)
CONFERENCE SERIES- INSTITUTE OF PHYSICS
Volume/pages
146(1995) , p. 333-336
ISSN
0951-3248
ISI
A1995BE73Q00070
Carrier
E
Target language
English (eng)
Abstract
The microstructure of defects and interfaces as well as interfacial reactions of the YBa2Cu3O7-x (YBCO) thin films on Si or Si on sapphire with single Y-stabilized ZrO2 (YSZ), double CeO2/YSZ or triple MgO/CeO2/YSZ buffer layer has been characterized by transmission electron microscopy The complex buffer made it possible to prevent detrimental interdiffusion and to control the orientation of YBCO layers.
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