Publication
Title
Structural aspects of the combination of Si and YBa2Cu3O7-x
Author
Abstract
The microstructure of defects and interfaces as well as interfacial reactions of the YBa2Cu3O7-x (YBCO) thin films on Si or Si on sapphire with single Y-stabilized ZrO2 (YSZ), double CeO2/YSZ or triple MgO/CeO2/YSZ buffer layer has been characterized by transmission electron microscopy The complex buffer made it possible to prevent detrimental interdiffusion and to control the orientation of YBCO layers.
Language
English
Source (journal)
CONFERENCE SERIES- INSTITUTE OF PHYSICS
Publication
1995
ISSN
0951-3248
Volume/pages
146(1995), p. 333-336
ISI
A1995BE73Q00070
UAntwerpen
Faculty/Department
Research group
Publication type
Subject
External links
Web of Science
Record
Identification
Creation 01.03.2012
Last edited 28.06.2017