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Title
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Structural aspects of the combination of Si and YBa2Cu3O7-x
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Author
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Abstract
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| The microstructure of defects and interfaces as well as interfacial reactions of the YBa2Cu3O7-x (YBCO) thin films on Si or Si on sapphire with single Y-stabilized ZrO2 (YSZ), double CeO2/YSZ or triple MgO/CeO2/YSZ buffer layer has been characterized by transmission electron microscopy The complex buffer made it possible to prevent detrimental interdiffusion and to control the orientation of YBCO layers. |
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Language
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English
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Source (journal)
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Institute of physics conference series. - Bristol, 1985, currens
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Publication
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Bristol
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Adam Hilger
,
1995
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ISSN
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0951-3248
[print]
2154-6630
[online]
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Volume/pages
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146
(1995)
, p. 333-336
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ISI
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A1995BE73Q00070
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