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Title
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How image processing can push electron microscopy to its limits
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Author
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Language
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English
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Source (book)
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International Conference on Image Processing, Oct. 23-26, 1995, Washington, D.C.
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Publication
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Los Alamitos
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IEEE, Computer Soc Press
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1995
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ISBN
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0-7803-3122-2
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Volume/pages
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(1995)
, p. C41-C44
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ISI
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A1995BE52H00340
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