Title
How image processing can push electron microscopy to its limits How image processing can push electron microscopy to its limits
Author
Faculty/Department
Faculty of Sciences. Physics
Publication type
conferenceObject
Publication
Los Alamitos :IEEE, Computer Soc Press, [*]
Subject
Physics
Engineering sciences. Technology
Computer. Automation
Source (book)
International Conference on Image Processing, Oct. 23-26, 1995, Washington, D.C.
ISBN
0-7803-3122-2
ISI
A1995BE52H00340
Carrier
E
Target language
English (eng)
Affiliation
University of Antwerp
E-info
http://gateway.webofknowledge.com/gateway/Gateway.cgi?GWVersion=2&SrcApp=PARTNER_APP&SrcAuth=LinksAMR&KeyUT=WOS:A1995BE52H00340&DestLinkType=FullRecord&DestApp=ALL_WOS&UsrCustomerID=ef845e08c439e550330acc77c7d2d848
Handle