Publication
Title
Synchrotron radiation induced X-ray microanalysis: A realistic alternative for electron- and ion-beam microscopy?
Author
Language
English
Source (journal)
SCANNING MICROSCOPY, SUPPLEMENT 7, 1993: PHYSICS OF GENERATION AND
DETECTION OF SIGNALS USED FOR MICROCHARACTERIZATION
Source (book)
11th Pfefferkorn Conference on Physics of Generation and Detection of, Signals Used for Microcharacterization, AUG 09-14, 1992, UNIV MASSACHUSETTS, AMHERST, MA
Publication
Chicago : Scanning microscopy international, 1994
ISBN
0-931288-45-2
Volume/pages
p. 191-208
ISI
A1994BD31D00013
UAntwerpen
Faculty/Department
Research group
Publication type
Subject
External links
Web of Science
Record
Identification
Creation 01.03.2012
Last edited 20.07.2017