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Title
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Synchrotron radiation induced X-ray microanalysis: A realistic alternative for electron- and ion-beam microscopy?
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Author
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Language
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English
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Source (journal)
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SCANNING MICROSCOPY, SUPPLEMENT 7, 1993: PHYSICS OF GENERATION AND
DETECTION OF SIGNALS USED FOR MICROCHARACTERIZATION
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Source (book)
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11th Pfefferkorn Conference on Physics of Generation and Detection of, Signals Used for Microcharacterization, AUG 09-14, 1992, UNIV MASSACHUSETTS, AMHERST, MA
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Publication
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Chicago
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Scanning microscopy international
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1994
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ISBN
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0-931288-45-2
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Volume/pages
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p. 191-208
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ISI
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A1994BD31D00013
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