Title
Synchrotron radiation induced X-ray microanalysis: A realistic alternative for electron- and ion-beam microscopy?Synchrotron radiation induced X-ray microanalysis: A realistic alternative for electron- and ion-beam microscopy?
Author
Faculty/Department
Faculty of Sciences. Chemistry
Research group
Department of Chemistry - other
Publication type
conferenceObject
Publication
Chicago :Scanning microscopy international,
Subject
Physics
Chemistry
Source (journal)
SCANNING MICROSCOPY, SUPPLEMENT 7, 1993: PHYSICS OF GENERATION AND
DETECTION OF SIGNALS USED FOR MICROCHARACTERIZATION
Source (book)
11th Pfefferkorn Conference on Physics of Generation and Detection of, Signals Used for Microcharacterization, AUG 09-14, 1992, UNIV MASSACHUSETTS, AMHERST, MA
Volume/pages
p. 191-208
ISBN
0-931288-45-2
ISI
A1994BD31D00013
Carrier
E
Target language
English (eng)
E-info
http://gateway.webofknowledge.com/gateway/Gateway.cgi?GWVersion=2&SrcApp=PARTNER_APP&SrcAuth=LinksAMR&KeyUT=WOS:A1994BD31D00013&DestLinkType=FullRecord&DestApp=ALL_WOS&UsrCustomerID=ef845e08c439e550330acc77c7d2d848