Publication
Title
Atomic resolution mapping using quantitative high-angle annular dark field scanning transmission electron microscopy
Author
Language
English
Source (journal)
Microscopy and microanalysis. - Cambridge, Mass.
Publication
Cambridge, Mass. : 2009
ISSN
1431-9276
Volume/pages
15:S:2(2009), p. 464-465
ISI
000208119100230
Full text (Publisher's DOI)
Full text (open access)
UAntwerpen
Faculty/Department
Research group
Publication type
Subject
Affiliation
Publications with a UAntwerp address
External links
Web of Science
Record
Identification
Creation 21.03.2012
Last edited 08.09.2017
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