Title
Atomic resolution mapping using quantitative high-angle annular dark field scanning transmission electron microscopy Atomic resolution mapping using quantitative high-angle annular dark field scanning transmission electron microscopy
Author
Faculty/Department
Faculty of Sciences. Physics
Publication type
article
Publication
Cambridge, Mass. ,
Subject
Physics
Source (journal)
Microscopy and microanalysis. - Cambridge, Mass.
Volume/pages
15(2009) :S:2 , p. 464-465
ISSN
1431-9276
Carrier
E
Target language
English (eng)
Full text (Publishers DOI)
Affiliation
University of Antwerp
Full text (open access)
https://repository.uantwerpen.be/docman/irua/a10e53/c8040c74.pdf
Handle