Publication
Title
Fully automated measurement of the modulation transfer function of charge-coupled devices above the Nyquist frequency
Author
Abstract
The charge-coupled devices used in electron microscopy are coated with a scintillating crystal that gives rise to a severe modulation transfer function (MTF). Exact knowledge of the MTF is imperative for a good correspondence between image simulation and experiment. We present a practical method to measure the MTF above the Nyquist frequency from the beam blocker's shadow image. The image processing has been fully automated and the program is made public. The method is successfully tested on three cameras with various beam blocker shapes.
Language
English
Source (journal)
Microscopy and microanalysis. - Cambridge, Mass.
Publication
Cambridge, Mass. : 2012
ISSN
1431-9276
Volume/pages
18:2(2012), p. 336-342
ISI
000302084700011
Full text (Publishers DOI)
UAntwerpen
Faculty/Department
Research group
Publication type
Subject
Affiliation
Publications with a UAntwerp address
External links
Web of Science
Record
Identification
Creation 21.03.2012
Last edited 26.05.2017
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