Publication
Title
Correction of non-linear thickness effects in HAADF STEM electron tomography
Author
Abstract
Language
English
Source (journal)
Ultramicroscopy. - Amsterdam
Publication
Amsterdam : 2012
ISSN
0304-3991
Volume/pages
116(2012), p. 8-12
ISI
000304473700002
Full text (Publisher's DOI)
Full text (publisher's version - intranet only)
UAntwerpen
Faculty/Department
Research group
Publication type
Subject
Affiliation
Publications with a UAntwerp address
External links
Web of Science
Record
Identification
Creation 21.03.2012
Last edited 21.08.2018
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