Publication
Title
X-ray absorption spectroscopy by full-field X-ray microscopy of a thin graphite flake: Imaging and electronic structure via the carbon K-edge
Author
Bittencourt, Carla
Hitchock, Adam P.
Ke, Xiaoxing
Van Tendeloo, Gustaaf
Ewels, Chris P.
Guttmann, Peter
Abstract
Language
English
Source (journal)
Beilstein journal of nanotechnology
Publication
2012
ISSN
2190-4286
Volume/pages
3(2012), p. 345-350
ISI
000303243400001
Full text (Publisher's DOI)
https://doi.org/10.3762/BJNANO.3.39
Full text (open access)
https://repository.uantwerpen.be/docman/irua/efc686/3ade3864.pdf
UAntwerpen
Faculty/Department
Faculty of Sciences. Physics
Research group
Electron microscopy for materials research (EMAT)
Project info
ELISA: European Light Sources Activities - Synchrotrons and Free Electron Lasers
Counting Atoms in Nanomaterials (COUNTATOMS).
Publication type
A1 Journal article
Subject
Physics
Engineering sciences. Technology
Affiliation
Publications with a UAntwerp address
External links
Web of Science
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Record
Identification
Creation
09.05.2012
Last edited
13.07.2018
To cite this reference
http://hdl.handle.net/10067/977030151162165141