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A compact mu-XRF spectrometer for (in situ) analyses of cultural heritage and forensic materials
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| Author |
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| Abstract |
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| A compact, light weight and relatively inexpensive mu-XRF instrument that allows for non-destructive and local analysis of sub-mm samples with minor/trace level sensitivity was developed. Two versions of this prototype instrument exist: a table-top version that can be used in a laboratory environment while for in situ measurements a readily transportable version was constructed. Polycapillary lenses are used to focus the primary X-ray beam down to the level of 70-100 mum in diameter. Relative detection limits of transition elements in biological and glass matrices are situated at the 10-100 ppm level. These instruments are useful for characterization of various materials from the cultural heritage and forensic sector. (C) 2003 Elsevier B.V. All rights reserved. | |
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English
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| Source (journal) |
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Nuclear instruments and methods in physics research: B: beam interactions with materials and atoms. - Amsterdam |
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INTERACTIONS WITH MATERIALS AND ATOMS |
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5th International Topical Meeting on Industrial Radiation and, Radioisotope Measurement Applications, JUN 09-14, 2002, BOLOGNA, ITALY |
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| Publication |
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Amsterdam : Elsevier science bv, 2004
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0168-583X
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213(2004), p. 693-698
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| ISI |
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000187020700138
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