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Title
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A compact mu-XRF spectrometer for (in situ) analyses of cultural heritage and forensic materials
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Author
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Abstract
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| A compact, light weight and relatively inexpensive mu-XRF instrument that allows for non-destructive and local analysis of sub-mm samples with minor/trace level sensitivity was developed. Two versions of this prototype instrument exist: a table-top version that can be used in a laboratory environment while for in situ measurements a readily transportable version was constructed. Polycapillary lenses are used to focus the primary X-ray beam down to the level of 70-100 mum in diameter. Relative detection limits of transition elements in biological and glass matrices are situated at the 10-100 ppm level. These instruments are useful for characterization of various materials from the cultural heritage and forensic sector. (C) 2003 Elsevier B.V. All rights reserved. |
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Language
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English
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Source (journal)
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Nuclear instruments and methods in physics research: B: beam interactions with materials and atoms. - Amsterdam
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INTERACTIONS WITH MATERIALS AND ATOMS
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Source (book)
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5th International Topical Meeting on Industrial Radiation and, Radioisotope Measurement Applications, JUN 09-14, 2002, BOLOGNA, ITALY
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Publication
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Amsterdam
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Elsevier science bv
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2004
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ISSN
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0168-583X
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DOI
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10.1016/S0168-583X(03)01687-2
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Volume/pages
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213
(2004)
, p. 693-698
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ISI
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000187020700138
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Full text (Publisher's DOI)
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