Publication
Title
SIMS profiling of GaAs/delta-AlAs/GaAs/ ... Heterostructures using polyatomic ionized oxygen clusters
Author
Abstract
Language
English
Source (journal)
Technical physics letters
Publication
2004
ISSN
1063-7850
Volume/pages
30:10(2004), p. 836-838
ISI
000224591000013
Full text (Publisher's DOI)
UAntwerpen
Publication type
Subject
External links
Web of Science
Record
Identification
Creation 12.07.2012
Last edited 03.07.2018