Publication
Title
Compositional analysis based upon electron holography and a chemically sensitive reflection
Author
Abstract
Language
English
Source (journal)
CONFERENCE SERIES- INSTITUTE OF PHYSICS
Source (book)
Royal-Microscopical-Society Conference on Microscopy of Semiconducting, Materials, MAR 25-29, 2001, UNIV OXFORD, OXFORD, ENGLAND
Publication
Bristol : Iop publishing ltd, 2001
ISBN
0-7503-0818-4
Volume/pages
169(2001), p. 33-36
ISI
000176465200007
UAntwerpen
Publication type
Subject
External links
Web of Science
Record
Identification
Creation 12.07.2012
Last edited 06.12.2018