Publication
Title
Exit wave reconstructions using through focus series of HREM images
Author
Abstract
The through focus exit wave reconstruction technique uses a series of high resolution electron microscopy images to reconstruct the complex electron wavefunction at the exit plane of the specimen. The feasibility of the through focus exit wave reconstruction method and its most important limitations are discussed. It is shown that-provided all aberrations of the microscope are well corrected for-a large improvement in the interpretability of the information can be obtained. Microsc. Res. Tech. 49:301-323, 2000. (C) 2000 Wiley-Liss, Inc.
Language
English
Source (journal)
Microscopy research and technique. - New York, N.Y.
Publication
New York, N.Y. : 2000
ISSN
1059-910X
Volume/pages
49:3(2000), p. 301-323
ISI
000086971800008
Full text (Publisher's DOI)
UAntwerpen
Publication type
Subject
External links
Web of Science
Record
Identification
Creation 12.07.2012
Last edited 04.06.2017