Title
The use of through focus exit wave reconstruction and quantitative electron diffraction in the structure determination of superconductors The use of through focus exit wave reconstruction and quantitative electron diffraction in the structure determination of superconductors
Author
Publication type
article
Publication
Oxford :Pergamon-elsevier science ltd ,
Subject
Chemistry
Source (journal)
Micron. - Oxford
Source (book)
56th Microscopy-Society-of-America Symposium on Advanced Electron, Microscopy in Superconductors, ,, ATLANTA, GEORGIA
Volume/pages
30(1999) :5 , p. 395-416
ISSN
0968-4328
ISI
000082046100005
Carrier
E
Target language
English (eng)
Full text (Publishers DOI)
Abstract
The feasibility of the through focus exit wave reconstruction method and its most important limitations are discussed. It is shown that combination of the amplitude and phase information of the exit waves at various thicknesses allows one to determine the positions of all atoms. Whereas the light atoms can be best distinguished in the phase image of a somewhat thicker part of a crystal, the heavy atoms can be observed most reliably in the amplitude part. In particular the change of the exit wave with thickness was found to be very useful in the determination of the presence of light atoms. (C) 1999 Published by Elsevier Science Ltd. All rights reserved.
E-info
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