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The use of through focus exit wave reconstruction and quantitative electron diffraction in the structure determination of superconductors
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| Author |
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| Abstract |
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| Language |
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English
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| Source (journal) |
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Micron. - Oxford | |
| Source (book) |
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56th Microscopy-Society-of-America Symposium on Advanced Electron, Microscopy in Superconductors, ,, ATLANTA, GEORGIA | |
| Publication |
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Oxford : Pergamon-elsevier science ltd, 1999
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| ISSN |
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0968-4328
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| Volume/pages |
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30:5(1999), p. 395-416
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| ISI |
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000082046100005
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| Full text (Publisher's DOI) |
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