Publication
Title
The use of through focus exit wave reconstruction and quantitative electron diffraction in the structure determination of superconductors
Author
Abstract
Language
English
Source (journal)
Micron. - Oxford
Source (book)
56th Microscopy-Society-of-America Symposium on Advanced Electron, Microscopy in Superconductors, ,, ATLANTA, GEORGIA
Publication
Oxford : Pergamon-elsevier science ltd, 1999
ISSN
0968-4328
Volume/pages
30:5(1999), p. 395-416
ISI
000082046100005
Full text (Publisher's DOI)
UAntwerpen
Publication type
Subject
External links
Web of Science
Record
Identification
Creation 12.07.2012
Last edited 13.09.2018