Publication
Title
Study of radiation damage and substrate resistivity effects from beam test of silicon microstrip detectors using LHC readout electronics
Author
Abstract
We present the beam test results of single-sided silicon microstrip detectors, with different substrate resistivities. The effects of radiation damage are studied for a detector irradiated to a fluence of 2.4 x 10(14) n/cm(2). The detectors are read out with the APV6 chip, which is compatible with the 40 MHz LHC clock, The performance of different detectors and readout modes are studied in terms of signal-to-noise ratio and efficiency. (C) 2002 Elsevier Science B.V. All rights reserved.
Language
English
Source (journal)
Nuclear instruments and methods in physics research: A: accelerators, spectrometers, detectors and associated equipment
Publication
2002
Volume/pages
488:1/2(2002), p. 85-93
ISI
000177752000007
Full text (Publisher's DOI)
Full text (publisher's version - intranet only)
UAntwerpen
Faculty/Department
Research group
Publication type
Subject
Affiliation
Publications with a UAntwerp address
External links
Web of Science
Record
Identification
Creation 19.07.2012
Last edited 04.08.2017
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