Publication
Title
Chemical characterization of the resin-dentin interface by micro-raman spectroscopy
Author
Abstract
The chemical nature of the interface between dentin and adhesive resin materials was characterized by micro-Raman spectroscopy. The resulting chemical profiles were correlated with photomicrographs obtained by SEM after an argon-ion-beam etching treatment of the sample surface. Two commercially available dentin adhesive systems, of which one was also applied with a different conditioning agent, were investigated. Raman spectra, which were recorded along line scans across the interface with a step increment of 1 mum, revealed that resin effectively penetrated 4 to 6 mum deep into the superficially decalcified dentin zone. Across the interface, a gradual transition from resin to dentin over the interdiffusion zone with a mixed contribution of both substances was noticed. Finally, resin appeared to penetrate to the entire decalcification depth of dentin regardless of the aggressiveness of the conditioning procedure.
Language
English
Source (journal)
Journal of dental research. - St. Louis, Mo.
Publication
St. Louis, Mo. : 1993
ISSN
0022-0345
DOI
10.1177/00220345930720101201
Volume/pages
72 :10 (1993) , p. 1423-1428
ISI
A1993MA59700012
Full text (Publisher's DOI)
UAntwerpen
Faculty/Department
Publication type
Subject
Affiliation
Publications with a UAntwerp address
External links
Web of Science
Record
Identifier
Creation 19.07.2012
Last edited 04.03.2024
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