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Chemical characterization of the resin-dentin interface by micro-raman spectroscopy
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| Abstract |
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| The chemical nature of the interface between dentin and adhesive resin materials was characterized by micro-Raman spectroscopy. The resulting chemical profiles were correlated with photomicrographs obtained by SEM after an argon-ion-beam etching treatment of the sample surface. Two commercially available dentin adhesive systems, of which one was also applied with a different conditioning agent, were investigated. Raman spectra, which were recorded along line scans across the interface with a step increment of 1 mum, revealed that resin effectively penetrated 4 to 6 mum deep into the superficially decalcified dentin zone. Across the interface, a gradual transition from resin to dentin over the interdiffusion zone with a mixed contribution of both substances was noticed. Finally, resin appeared to penetrate to the entire decalcification depth of dentin regardless of the aggressiveness of the conditioning procedure. | | |
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English
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| Source (journal) |
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Journal of dental research. - St. Louis, Mo. | |
| Publication |
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St. Louis, Mo. : 1993
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| ISSN |
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0022-0345
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| Volume/pages |
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72:10(1993), p. 1423-1428
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| ISI |
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A1993MA59700012
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