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Title
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Enhancing industrial inspection with efficient edge illumination X-ray phase contrast simulations
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Author
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Abstract
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| X-ray imaging is routinely used in non-destructive testing, where x-ray projections of an object are compared to a ground truth to detect anomalies. This ground truth can be simulated x-ray projections of a computer-aided design model of the object. While conventional x-ray imaging excels at distinguishing high from low absorbing materials, x-ray phase contrast imaging delivers higher contrast between different low absorbing materials. However, this requires efficient x-ray phase contrast imaging compatible computer-aided design projection simulation software, to generate the ground truth images. Currently available x-ray phase contrast imaging simulation tools are either notoriously slow Monte-Carlo simulators, or equally slow explicit wavefront propagation simulators. In this work, a recently developed computer-aided design projector toolbox is used to model the edge illumination x-ray phase contrast imaging setup within a GPU-based ray tracing framework, significantly speeding up simulations. Results for two industrial samples are shown. One has artificially introduced defects and the other is compared to a real edge illumination acquisition, demonstrating the potential to accurately and efficiently simulate phase contrast images, directly from a computer-aided design model. This paves the way for edge illumination to be applied in non-destructive testing. |
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Language
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English
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Source (book)
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IEEE EUROCON 2023 - 20th International Conference on Smart Technologies, 06-08 July 2023, Torino, Italy
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Publication
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IEEE
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2023
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ISBN
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978-1-6654-6397-3
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DOI
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10.1109/EUROCON56442.2023.10199074
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Volume/pages
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p. 723-727
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Full text (Publisher's DOI)
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Full text (open access)
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Full text (publisher's version - intranet only)
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